Probe Holders, Probes and Adapters

Description

FemtoProbe COAX Probe
Application	Ultra low noise I-V, pulsed I-V measurement
Current Leakage	<10fA
Cable	N.A.* See page 16 for cable assemblies.
Connector	SMA, female, gold plated
Breakdown voltage	500V
Adapters	Purchase Separately. FP-A100 or FP-A200.
*Cable assemblies and adapters purchased separately.

FemtoProbe Replacement Tips
Application	FemtoProbe replacement tips.
Tips Diameter	5μm, 10μm, 20μm
Probe bend	45 or 60 degree in one bend 45 or 60 degree in dual bend

FP-A100 Probe Adapter
Application	FemtoProbe and CPA-10 probe adapter to positioners.
Positioner compatibility	DTP100, DCP100, HPP100
Features	N.A.* See page 16 for cable assemblies.

FP-A200 Probe Adapter
Application	FemtoProbe and CPA-10 probe adapter to positioners.
Positioner compatibility	DTP100, DCP100, HPP100
Features	Pivoted heads for flexible probing.

S10-COAX-BNC Probeholder
Application	Optimized I-V test, C-V tests
Current Leakage	<10pA
Cable	2m Coax Cable (Available in different lengths)
Connector	BNC, male, silver (contact finish)
Breakdown voltage	500V

S10-COAX-SMA Probeholder
Application	Ultra-fast I-V tests: pulsed I-V, transient I-V, and pulsed sourcing.
Current Leakage	<10pA
Cable	2m Coax Cable (Available in different lengths)
Connector	SMA, Jack/Plug, gold (contact finish)
Breakdown voltage	500V

S10-TRIAX Probeholder
Application	Optimized I-V test, C-V tests
Current Leakage	<100fA
Cable	2m TRIAX Cable (Available in different lengths)
Connector	Triax, Jack/Plug, gold (contact finish)
Breakdown voltage	500V

S10-BA Probeholder
Application	Basic I-V test
Current Leakage	<10nA
Cable	2m flexible cable (Available in different lengths)
Connector	Banana, shrouded plug, nickel (contact finish)
Breakdown voltage	500V

CPA-10 COAX Probe
Application	Excellent performance with LCR, Low noise I-V measurement
Current Leakage	<10fA
Residual Capacitance	<10fF (Tested by LCR)
Cable	N.A. See page 16 for cable assemblies.
Connector	SSMC, Plug, gold plated
Breakdown voltage	500V
Adapters	N.A.*
*Cable assemblies and adapters purchased separately.

CPA-10 Replacement Tips
Application	CPA-10 replacement tips.
Tips Diameter	5μm, 10μm, 20μm
Probe bend	45 or 60 degree in one bend 45 or 60 degree in dual bend

Probeholder Disposable Probe Tips
Application	S10 Series Probeholder replacement Tips
Material	Tungsten
Tip Diameter	5μm, 10μm, 20μm
Length	50mm
Finish	Nickel

Probeholder Disposable Probe Tips – Catwhisker
Application	S10 Series Probeholder replacement Tips ideal for submicron or thin film probing.
Material	Tungsten-Tip, Copper-Shaft
Tip Diameter	0.2μm, 1μm, 5μm
Length	60mm
Finish	Nickel(Shaft)
RF/mmW Probes, Multicontact Wedges
Application	High-performance RF, multi-contact/mixed signal probing High-performance versatile wafer-level reliability probing Single-ended broadband/mmWave, THz, source/load pull, RF noise probing.
Footprint	GS, SG, SGSG, or differential
Pitch	Customized when ordered
Calibration Substrate	N.A.*
Adapters	N.A.*
*Calibration Substrate and adapters are purchased separately.
RFH-100 RF Probe to Positioner Adapter
Application	RF probes adapters to positioners
Positioner compatibility	DCP100, RFP100
Features	Rigid structures. 10° horizontal tilting range for probe tip planarity alignment to pads. Available in south, east, north and west.
12C High Impedance Active Probe (Picoprobes)
Application	High speed, high input impedance active probe for measuring the internal node voltage of integrated circuits.
Input Capacitance	Tungsten-Tip, Copper-Shaft
Input Resistance	0.2μm, 1μm, 3μm
Bandwidth	60mm
Linearity	Nickel(Shaft)
Voltage Range	0.2μm, 1μm, 3μm
Gain Accuracy	60mm
Signal Attenuation	(High Input impedance oscilloscope: 10 to 1) (50 ohm input: 20 to 1)
12C Replacement Tips
Application	12C replacement probe tips.
Radius	<0.1μm, <1μm, <2μm, <3μm, <5μm

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